Multibeam X-ray tomography optical system for narrow-energy-bandwidth synchrotron radiation

Wolfgang Voegeli; Haruki Takayama; Xiaoyu Liang; Tetsuroh Shirasawa; Etsuo Arakawa; Hiroyuki Kudo; Wataru Yashiro

doi:10.35848/1882-0786/ad2aff

Applied Physics Express (Jan 2024)

Multibeam X-ray tomography optical system for narrow-energy-bandwidth synchrotron radiation

Wolfgang Voegeli,
Haruki Takayama,
Xiaoyu Liang,
Tetsuroh Shirasawa,
Etsuo Arakawa,
Hiroyuki Kudo,
Wataru Yashiro

Affiliations

Wolfgang Voegeli: ORCiD; Faculty of Education, Tokyo Gakugei University , Koganei, Tokyo 184-8501, Japan
Haruki Takayama: Faculty of Education, Tokyo Gakugei University , Koganei, Tokyo 184-8501, Japan
Xiaoyu Liang: Institute of Multidisciplinary Research for Advanced Materials (IMRAM), Tohoku University , Sendai, Miyagi 980-8577, Japan
Tetsuroh Shirasawa: ORCiD; Research Institute for Material and Chemical Measurement, National Institute of Advanced Industrial Science and Technology (AIST) , Tsukuba, Ibaraki 305-8563, Japan
Etsuo Arakawa: Faculty of Education, Tokyo Gakugei University , Koganei, Tokyo 184-8501, Japan
Hiroyuki Kudo: Institute of Systems and Information Engineering, University of Tsukuba , 1-1-1 Tennoudai, Tsukuba, Ibaraki 305-8573, Japan; International Center for Synchrotron Radiation Innovation Smart (SRIS), Tohoku University , Sendai, Miyagi 980-8577, Japan
Wataru Yashiro: Institute of Multidisciplinary Research for Advanced Materials (IMRAM), Tohoku University , Sendai, Miyagi 980-8577, Japan; International Center for Synchrotron Radiation Innovation Smart (SRIS), Tohoku University , Sendai, Miyagi 980-8577, Japan; Department of Applied Physics, School of Engineering, The University of Tokyo , Bunkyo-ku, Tokyo 113-8656, Japan

DOI: https://doi.org/10.35848/1882-0786/ad2aff
Journal volume & issue: Vol. 17, no. 3
p. 032002

Abstract

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The design and evaluation experiments of a multibeam X-ray tomography optical system that can be used with synchrotron radiation from sources with a narrow energy bandwidth, i.e. undulator sources, are reported. It consists of silicon single crystals that diffract the incident X-rays to 27 beams, which are used to image a sample. The energy of the beams was aligned with an accuracy sufficient for use at typical undulator beamlines. Projection images of a test sample were collected and successfully reconstructed, showing the feasibility of a high-speed X-ray tomography instrument based on the optical system.

Published in Applied Physics Express

ISSN: 1882-0778 (Print); 1882-0786 (Online)
Publisher: IOP Publishing
Country of publisher: United Kingdom
LCC subjects: Science: Physics
Website: https://iopscience.iop.org/journal/1882-0786

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