IEEE Photonics Journal (Jan 2020)

Ultra-High Resolution Wideband on-Chip Spectrometer

  • Mehedi Hasan,
  • Mohammad Rad,
  • Gazi Mahamud Hasan,
  • Peng Liu,
  • Patrick Dumais,
  • Eric Bernier,
  • Trevor J. Hall

DOI
https://doi.org/10.1109/JPHOT.2020.3021676
Journal volume & issue
Vol. 12, no. 5
pp. 1 – 17

Abstract

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Monitoring the state of the optical network is a key enabler for programmability of network functions, protocols and efficient use of the spectrum. A particular challenge is to provide the SDN-EON controller with a panoramic view of the complete state of the optical spectrum. This paper describes an architecture for compact on-chip spectrometry targeting high resolution across the entire C-band to reliably and accurately measure the spectral profile of WDM signals in fixed and flex-grid architectures. An industry standard software tool is used to validate the performance of the spectrometer. The fabrication of the proposed design is found to be practical.

Keywords