Orientation mapping of cp-Ti by reflected polarized light microscopy

Abstract

Deformation and fracture mechanisms, and therefore mechanical behavior, in metals and metallic alloys with hexagonal close packed structures, such as α-Ti, strongly depend on the crystal c-axis orientation of the grains. Taking advantage of the intrinsic optical anisotropy that these structures present, a computer-aided method based on conventional reflected polarized light microscopy has been developed for c-axis orientation mapping. The application of the method on texture-free and textured commercially pure Ti is proposed for the examination of relevant crystallographic features.