Burn - in Test Detection Method for Electronic Products based on VFSA – ELM

• Yanming Lee,
• Hong - yi Zhang,
• Jiangshui Hong,
• Weiqi Lee,
• Jimmi Rosa

Affiliations

Yanming Lee

School of P h oto - Electronic and Communication Engineering, Xiamen University of Technology Xiamen, 361024, China

Hong - yi Zhang

School of P h oto - Electronic and Communication Engineering, Xiamen University of Technology Xiamen, 361024, China

Jiangshui Hong

School of Computer Sci ence, Durham University, Durham , DH1 3LE, United Kingdom

Weiqi Lee

School of P h oto - Electronic and Communication Engineering, Xiamen University of Technology Xiamen, 361024, China

Jimmi Rosa

School of Engineering and Computer Science, Victoria Unive rsity of Wellington, Wellington , PO Box 600 , New Zealand