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Microsystems & Nanoengineering
(Oct 2022)
Integrated 64 pixel UV image sensor and readout in a silicon carbide CMOS technology
Joost Romijn,
Sten Vollebregt,
Luke M. Middelburg,
Brahim El Mansouri,
Henk W. van Zeijl,
Alexander May,
Tobias Erlbacher,
Johan Leijtens,
Guoqi Zhang,
Pasqualina M. Sarro
Affiliations
Joost Romijn
Laboratory of Electronic Components, Technology and Materials (ECTM), Department of Microelectronics, Delft University of Technology
Sten Vollebregt
Laboratory of Electronic Components, Technology and Materials (ECTM), Department of Microelectronics, Delft University of Technology
Luke M. Middelburg
Laboratory of Electronic Components, Technology and Materials (ECTM), Department of Microelectronics, Delft University of Technology
Brahim El Mansouri
Laboratory of Electronic Components, Technology and Materials (ECTM), Department of Microelectronics, Delft University of Technology
Henk W. van Zeijl
Laboratory of Electronic Components, Technology and Materials (ECTM), Department of Microelectronics, Delft University of Technology
Alexander May
Fraunhofer Institute for Integrated Systems and Devices Technology IISB
Tobias Erlbacher
Fraunhofer Institute for Integrated Systems and Devices Technology IISB
Johan Leijtens
Lens R&D
Guoqi Zhang
Laboratory of Electronic Components, Technology and Materials (ECTM), Department of Microelectronics, Delft University of Technology
Pasqualina M. Sarro
Laboratory of Electronic Components, Technology and Materials (ECTM), Department of Microelectronics, Delft University of Technology
DOI
https://doi.org/10.1038/s41378-022-00446-3
Journal volume & issue
Vol. 8, no. 1
pp. 1 – 17
Abstract
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No abstracts available.
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