Author Correction: Nanoscale-femtosecond dielectric response of Mott insulators captured by two-color near-field ultrafast electron microscopy

Affiliations

Xuewen Fu: School of Physics, Ultrafast Electron Microscopy Laboratory, Nankai University
Francesco Barantani: Institute of Physics, Laboratory for Ultrafast Microscopy and Electron Scattering (LUMES), École Polytechnique Fédérale de Lausanne
Simone Gargiulo: Institute of Physics, Laboratory for Ultrafast Microscopy and Electron Scattering (LUMES), École Polytechnique Fédérale de Lausanne
Ivan Madan: Institute of Physics, Laboratory for Ultrafast Microscopy and Electron Scattering (LUMES), École Polytechnique Fédérale de Lausanne
Gabriele Berruto: Institute of Physics, Laboratory for Ultrafast Microscopy and Electron Scattering (LUMES), École Polytechnique Fédérale de Lausanne
Thomas LaGrange: Institute of Physics, Laboratory for Ultrafast Microscopy and Electron Scattering (LUMES), École Polytechnique Fédérale de Lausanne
Lei Jin: Department of Materials Science and Engineering, University of California
Junqiao Wu: Department of Materials Science and Engineering, University of California
Giovanni Maria Vanacore: Department of Materials Science, University of Milano-Bicocca
Fabrizio Carbone: Institute of Physics, Laboratory for Ultrafast Microscopy and Electron Scattering (LUMES), École Polytechnique Fédérale de Lausanne
Yimei Zhu: Condensed Matter Physics and Material Science Department, Brookhaven National Laboratory

Abstract

A Correction to this paper has been published: https://doi.org/10.1038/s41467-021-22477-6