AIP Advances (Dec 2017)

Conduction band fluctuation scattering due to alloy clustering in barrier layers in InAlN/GaN heterostructures

  • Qun Li,
  • Qian Chen,
  • Jing Chong

DOI
https://doi.org/10.1063/1.5003195
Journal volume & issue
Vol. 7, no. 12
pp. 125103 – 125103-8

Abstract

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In InAlN/GaN heterostructures, alloy clustering-induced InAlN conduction band fluctuations interact with electrons penetrating into the barrier layers and thus affect the electron transport. Based on the statistical description of InAlN compositional distribution, a theoretical model of the conduction band fluctuation scattering (CBFS) is presented. The model calculations show that the CBFS-limited mobility decreases with increasing two-dimensional electron gas sheet density and is inversely proportional to the squared standard deviation of In distribution. The AlN interfacial layer can effectively suppress the CBFS via decreasing the penetration probability. This model is directed towards understanding the transport properties in heterostructure materials with columnar clusters.