High Temperature Materials and Processes (Aug 2000)

Theoretical Estimation of Diffusion Coefficients of Impurities in Silicon Melt

  • Mitev, Pavlin D.,
  • Saito, Masatoshi,
  • Waseda, Yoshio,
  • Sato, Yuzuru

DOI
https://doi.org/10.1515/HTMP.2000.19.5.307
Journal volume & issue
Vol. 19, no. 5
pp. 307 – 312

Abstract

Read online

No abstracts available.