The microstructural representation and fractal nature intepolation analysis of feldspar

Abstract

This paper presents a comparative analysis of microstructural parameters by the powder X-ray diffraction method on a polycrystalline sample and the fractal analysis. The presented results of microstructural parameters are obtained by crystallographic programs FullProf based on the Rietveld method. The synthetic Ba/Ca-celsian sample has been used for microstructural parameters analysis. The feldspar sample has been synthesized by the thermal induction phase transformation process of ion exchange Ca-LTA zeolite with Ba cation. After the ion exchange Ba/Ca-LTA, the sample was heated at the temperature of 1300°C and the structure of Ba/Ca-feldspar was determined by the X-ray powder diffraction analysis. The X and U shape parameters that contribute to the strain have been reconstructed by fractal interpolation. Once we can reconstruct the shapes, which are quantum mechanics effects, we should provide the data for predicting desired parameters mentioned previously. We reported in this paper the successful application of this advanced and deep microstructure analysis, which confirmed original fractal copies based on the presented morphology characterization.

Keywords

• microstructure
• crystallographic software
• feldspar
• x-ray diffraction analysis
• fractal interpolation