Temperature dependence of FMR and magnetization in nanocrystalline zinc ferrite thin films

Abstract

Single phase nano-crystalline zinc ferrite thin films were deposited by RF-magnetron sputtering on quartz substrate at room temperature (RT) in pure Argon environment and annealed (in air) at different temperatures. Temperature dependence of magnetization was studied on these films using both VSM and by observing FMR (in X band). Value of exchange stiffness constant (D) was obtained by fitting Bloch’s law to the low temperature magnetization data. The value of D decreased monotonously with the annealing temperature (TA) of the samples. A film annealed at TA = 523 K, exhibited the highest magnetization value. The FMR line width of the films decreased with increase in measurement temperature. At RT (∼293 K), the lowest value of line width (ΔH) was 15 kA/m and 13 kA/m in parallel and perpendicular configuration respectively for the sample annealed at TA = 623 K.