Author Correction: Orientational Mapping Augmented Sub-Wavelength Hyper-Spectral Imaging of Silk

Affiliations

Meguya Ryu: Tokyo Institute of Technology
Armandas Balčytis: Nanotechnology facility, Center for Micro-Photonics, Swinburne University of Technology
Xuewen Wang: Nanotechnology facility, Center for Micro-Photonics, Swinburne University of Technology
Jitraporn Vongsvivut: Infrared Microspectroscopy Beamline, Australian Synchrotron
Yuta Hikima: Department of Chemical Engineering, Graduate School of Engineering, Kyoto University
Jingliang Li: Institute for Frontier Materials, Deakin University
Mark J. Tobin: Infrared Microspectroscopy Beamline, Australian Synchrotron
Saulius Juodkazis: Nanotechnology facility, Center for Micro-Photonics, Swinburne University of Technology
Junko Morikawa: Tokyo Institute of Technology

Abstract

A correction to this article has been published and is linked from the HTML version of this paper. The error has been fixed in the paper.