Identifying transient defects in exsolution of nanoparticles by semi-quantitative ABF STEM imaging

• Rosnes Andreas,
• von Wenchstern Holger,
• Polfus Jonathan,
• Prytz Øystein

Affiliations

Rosnes Andreas

Department of Physics, University of Oslo

von Wenchstern Holger

Department of Physics, University of Oslo

Polfus Jonathan

Department of Chemistry, University of Oslo

Prytz Øystein

Department of Physics, University of Oslo