In situ polarization and dielectric property measurements of Pb(Zr0.52Ti0.48)O3 ferroelectric nanocrystals

Haifa Zhai; Yurong Jiang; Hongjing Li; Panpan Zhang; Yixiao He; Dandan Shi; Xiang Zhang; Jien Yang

Heliyon (Jun 2017)

In situ polarization and dielectric property measurements of Pb(Zr0.52Ti0.48)O3 ferroelectric nanocrystals

Haifa Zhai,
Yurong Jiang,
Hongjing Li,
Panpan Zhang,
Yixiao He,
Dandan Shi,
Xiang Zhang,
Jien Yang

Affiliations

Haifa Zhai: Henan Key Laboratory of Photovoltaic Materials, College of Physics and Materials Science, Henan Normal University, Xinxiang 453007, People’s Republic of China; National Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, People’s Republic of China; Corresponding author.
Yurong Jiang: Henan Key Laboratory of Photovoltaic Materials, College of Physics and Materials Science, Henan Normal University, Xinxiang 453007, People’s Republic of China
Hongjing Li: Henan Key Laboratory of Photovoltaic Materials, College of Physics and Materials Science, Henan Normal University, Xinxiang 453007, People’s Republic of China
Panpan Zhang: Henan Key Laboratory of Photovoltaic Materials, College of Physics and Materials Science, Henan Normal University, Xinxiang 453007, People’s Republic of China
Yixiao He: Henan Key Laboratory of Photovoltaic Materials, College of Physics and Materials Science, Henan Normal University, Xinxiang 453007, People’s Republic of China
Dandan Shi: Henan Key Laboratory of Photovoltaic Materials, College of Physics and Materials Science, Henan Normal University, Xinxiang 453007, People’s Republic of China
Xiang Zhang: Henan Key Laboratory of Photovoltaic Materials, College of Physics and Materials Science, Henan Normal University, Xinxiang 453007, People’s Republic of China
Jien Yang: Henan Key Laboratory of Photovoltaic Materials, College of Physics and Materials Science, Henan Normal University, Xinxiang 453007, People’s Republic of China

Journal volume & issue: Vol. 3, no. 6
p. e00313

Abstract

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Pb(Zr0.52Ti0.48)O3/polycarbonate (PZT/PC) composite films with different concentration of PZT ferroelectric nanocrystals are prepared. The polarization and dielectric relaxation behavior of PZT ferroelectric nanocrystals are characterized using in situ transmittance and X-ray diffraction (XRD) measurements for the first time. It’s found that 10% PZT/PC composite film has the largest orientation change and negligible dielectric relaxation after poling (the φ value of 13.8% is almost constant with time even for 168 h). Based on the XRD results, we consider that the preferential orientation of PZT nanocrystals to align in PC matrix after poling is [001] direction.

Published in Heliyon

ISSN: 2405-8440 (Online)
Publisher: Elsevier
Country of publisher: United Kingdom
LCC subjects: Science: Science (General); Social Sciences: Social sciences (General)
Website: https://www.cell.com/heliyon/home

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