Electrical properties of thin films of semiconductor solid solutions (CuInSe2)x-(2ZnSe)1-x

I. N. Tsyrelchuk; V. V. Khoroshko; V. F. Gremenok; V. A. Ivanov

Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki (Jun 2019)

Electrical properties of thin films of semiconductor solid solutions (CuInSe2)x-(2ZnSe)1-x

I. N. Tsyrelchuk,
V. V. Khoroshko,
V. F. Gremenok,
V. A. Ivanov

Affiliations

I. N. Tsyrelchuk: Белорусский государственный университет информатики и радиоэлектроники
V. V. Khoroshko: Белорусский государственный университет информатики и радиоэлектроники
V. F. Gremenok: ГНПО «Научно-практический центр НАН Беларуси по материаловедению»
V. A. Ivanov: ГНПО «Научно-практический центр НАН Беларуси по материаловедению»

Journal volume & issue: Vol. 0, no. 8
pp. 95 – 100

Abstract

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Dependences of resistivity and thermal e.m.f. of the Cu(In,Zn)Se2 films on the phase composition and temperature were studied. The temperature dependence of the resistivity in the temperature range of T = 8…420 K were measured. The dependence of films resistivity and their thermal e.m.f. coefficient on the concentration of Zn atoms and the correlation between films thermal e.m.f. coefficient and their resistivity were investigated.

Published in Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki

ISSN: 1729-7648 (Print)
Publisher: Educational institution «Belarusian State University of Informatics and Radioelectronics»
Country of publisher: Belarus
LCC subjects: Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
Website: https://doklady.bsuir.by/

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