Nickel Doped Zinc Oxide Thin Films for Visible Blind Ultraviolet Photodetection Applications

Abstract

The current research aims to investigate the effect of nickel doping on the structural and opto-electrical characteristics of zinc oxide thin films. Sol-gel spin coating technique has been utilized to deposit Zn _1-x Ni _x O (x = 0, 0.005, 0.010, and 0.015) films on glass substrates. X-ray diffraction (XRD) analysis confirms the formation of crystalline zinc oxide thin films with hexagonal wurtzite structure. Williamson-Hall analysis has been performed to study the individual contribution of lattice strain and crystallite size to the peak broadening in the XRD pattern. Scanning electron microscopy (SEM), Photoluminescence spectroscopy, and UV–visible spectroscopic techniques have been used to examine the surface morphology and optical properties of the deposited films. Transient photocurrent measurements have been performed on all the films under the exposure of ultraviolet (UV) light of wavelengths 365 and 254 nm with on/off cycle of 100 s, and various device key parameters such as sensitivity, responsivity, and quantum efficiency, etc have been determined. Sensitivities of the fabricated photodetectors (PDs) are found to be 5463%, 3809%, 3100%, and 831% for pristine ZnO, Zn _0.995 Ni _0.005 O, Zn _0.99 Ni _0.01 O, and Zn _0.985 Ni _0.015 O, respectively. The UV photodetection mechanism, which is based on the interaction between chemisorbed oxygen on the surface of ZnO and photo-generated holes, has been thoroughly discussed.

Keywords

• Ni-doped ZnO
• nanocrystalline thin film
• photodetector
• sensitivity
• responsivity