Spiral Annealing of Magnetic Microwires

Abstract

A preprocessing technique named “spiral annealing” was applied for the first time to magnetic microwires. In this process, the sample was arranged in a flat spiral shape during annealing, and subsequent measurements were conducted on the unbent sample with the induced stress distribution along and transverse to the sample. The research utilized both magnetic and magneto-optical methods. The anisotropy field magnitude in both the volume and surface of the microwire was measured, and for the first time, a direct correlation between the anisotropy field and the curvature of a spirally annealed microwire was established. Additionally, a connection between the type of surface domain structure and the degree of spiral curvature was identified. The preservation of the distribution of spiral annealing-induced magnetic properties both along and across the microwire is a key effect influencing the technological application of the microwire. The range of induced curvature within which a specific helical magnetic structure can exist was also determined. This insight links the conditions of spiral annealing to the selection of microwires as active elements in magnetic sensors.

Keywords

• soft magnetic materials
• amorphous magnetic microwires
• magnetic domains
• magneto-optic Kerr effect
• magnetic anisotropy