Dielectric spectroscopy of VO2 nanocrystalline films

Abstract

The article describes the first reported case of applying dielectric spectroscopy to study nontrivial details of size dependences of phase transformation parameters in nanocrystallites of VO2 films. The method allows to identify the electrophysical parameters of nanocrystalline sets of different sizes and random location on the VO2 substrate. The article investigates the martensitic nature of the Mott-Peierls semiconductor-metal phase transition in crystalline VO2 films.

Keywords

• dielectric spectroscopy
• vanadium dioxide films
• VO2
• semiconductor-metal phase transition
• correlation effects