Elastic Modulus Determination of Nanolayers by the Atomic-Force Microscopy Method

Abstract

We defined the local elastic modulus of single layer, polyvinylpyridine (PVP), and two-layer, polymethylmethacrylate coated with a polyvinylpyridine (PMMA+PVP). Polymer films with nanometer thickness (10-13 nm) formed on the silicon surface using the Langmuir-Blodgett method. The experiment was conducted using the static force spectroscopy mode of atomic force microscopy method provides data about the bending of the console of the probe during its contact with the surface of the sample. Estimates were based on a mathematical model of contact deformation of layered systems, taking into account the thickness of the coating and the effect of the substrate. Based on the data of the elastic properties of thin coatings has been suggested the influence of the hyperfine polymer layer of PMMA to the properties of two-layer coating as a result of its force fields of silicon screening, which have a structuring effect on the inflicted layer.

Keywords

• atomic force microscopy
• langmuir-blodgett films
• elastic modulus