A 0.9 V high‐speed dynamic bias latch‐type comparator employing a voltage‐controlled delay line

Abstract

Abstract This paper presents a novel dynamic bias latch‐type comparator combined with a voltage‐controlled delay line (VCDL), designed specifically for low‐power and low‐noise applications in high‐speed analog‐to‐digital converters (ADCs). The incorporation of the VCDL precedes the dynamic bias amplifier in the proposed comparator, thereby achieving a balance between energy efficiency and high‐speed operation. This innovative design enhances the input common voltage of the dynamic bias amplifier through the utilization of the VCDL, surpassing that of a conventional dynamic bias comparator. Furthermore, it demonstrates increased adaptability in technology scaling and efficient operation at lower supply voltages, leveraging inverters and other simple cells. The proposed comparator in 28 nm process technology achieves a 309.7 µV input‐referred noise while consuming approximately 145.8 fJ and completing comparisons in 125 ps with a 0.9 V supply and a 0.45 V input common‐mode voltage.

Keywords

• comparators (circuits)
• convertors
• data acquisition
• delay circuits