Journal of Advanced Mechanical Design, Systems, and Manufacturing (May 2018)
Iterative improvement approaches for collecting weighted items in directed bipartite graphs
Abstract
In this paper, an iterative improvement heuristic based on the simulated annealing is designed for a weighted item collecting problem in directed bipartite graphs. The weighted item collecting problem is a generalization of an integrated circuit design problem, and it is also a variant of 0-1 knapsack problems in graphs. Recently, a greedy heuristic algorithm has been presented for the weighted item collecting problem. The greedy heuristic algorithm obtains an optimal solution of a known test instance of the original integrated circuit design problem in a short execution time, while for a randomly generated instance, there may be some room for improvement of the heuristic quality. In order to search for a better heuristic solution, some neighborhood structures for an incumbent solution are defined, and each of them is embedded in a framework of the simulated annealing. Numerical experiments are conducted to examine the iterative improvement performance, and the results are reported.
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