IEEE Access (Jan 2021)

Suppression of Back-Reflection From the End Face of Si<sub>3</sub>N<sub>4</sub> Waveguide Resonator

  • Changkun Feng,
  • Danni Liu,
  • Peiren Ni,
  • Hui Li,
  • Lishuang Feng

DOI
https://doi.org/10.1109/ACCESS.2021.3059746
Journal volume & issue
Vol. 9
pp. 28897 – 28903

Abstract

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Silicon nitride waveguide (Si3N4), is used as the most important sensitive device because of its excellent high-polarizing characteristics. It has the potential to build the miniaturized, high-precision resonant integrated optical gyroscope (RIOG) in recent years. However, the back-reflection caused by the refractive index difference between the Si3N4 waveguide and the pigtail fiber has a non-negligible impact on the accuracy of the gyroscope. In this paper, we propose a method to suppress the back-reflection of the end face of the Si3N4 waveguide resonator. We use the Fimmprop module of the simulation software Photon Design to simulate the relationship between the back-reflection coefficient of Si3N4 waveguide and different tilt angles. The simulation result shows that when the end face of the Si3N4 waveguide is oblique cut by 15°, the back-reflection is the minimum, about -67 dB. The back-reflection obtained through the experiments are about -65 dB, consistent with the simulation result. Together, our data suggested that the back-reflection noise of the Si3N4 can be suppressed by the oblique cutting of the end face by 15°. The conclusion can lay a foundation for improving the performance of RIOG based on Si3N4 waveguide resonator.

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