Femtosecond pulsed laser deposited Er3+-doped zinc-sodium tellurite glass on Si: Thin-film structural and photoluminescence properties

Thomas Mann; Billy Richards; Eric Kumi-Barimah; Robert Mathieson; Matthew Murray; Zoran Ikonic; Paul Steenson; Christopher Russell; Gin Jose

doi:10.1063/1.5097506

AIP Advances (Aug 2019)

Femtosecond pulsed laser deposited Er3+-doped zinc-sodium tellurite glass on Si: Thin-film structural and photoluminescence properties

Thomas Mann,
Billy Richards,
Eric Kumi-Barimah,
Robert Mathieson,
Matthew Murray,
Zoran Ikonic,
Paul Steenson,
Christopher Russell,
Gin Jose

Affiliations

Thomas Mann: School of Chemical and Process Engineering, University of Leeds, Leeds LS2 9JT, UK
Billy Richards: School of Chemical and Process Engineering, University of Leeds, Leeds LS2 9JT, UK
Eric Kumi-Barimah: School of Chemical and Process Engineering, University of Leeds, Leeds LS2 9JT, UK
Robert Mathieson: School of Chemical and Process Engineering, University of Leeds, Leeds LS2 9JT, UK
Matthew Murray: School of Chemical and Process Engineering, University of Leeds, Leeds LS2 9JT, UK
Zoran Ikonic: School of Electronic and Electrical Engineering, University of Leeds, Leeds LS2 9JT, UK
Paul Steenson: School of Electronic and Electrical Engineering, University of Leeds, Leeds LS2 9JT, UK
Christopher Russell: School of Electronic and Electrical Engineering, University of Leeds, Leeds LS2 9JT, UK
Gin Jose: School of Chemical and Process Engineering, University of Leeds, Leeds LS2 9JT, UK

DOI: https://doi.org/10.1063/1.5097506
Journal volume & issue: Vol. 9, no. 8
pp. 085324 – 085324-10

Abstract

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We characterise the thin-film structural properties and photoluminescence of femtosecond (40 fs, 800 nm) pulsed laser deposited Er3+-doped zinc-sodium tellurite glass on Si as a function of laser fluence. The laser fluence regime required for the formation of films composed of nanoparticles without droplets is found, the composition and crystallinity of the deposited material is reported and the photoluminescence of the films is characterised in dependence of film thickness.

Published in AIP Advances

ISSN: 2158-3226 (Online)
Publisher: AIP Publishing LLC
Country of publisher: United States
LCC subjects: Science: Physics
Website: http://aipadvances.aip.org/

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