Influence of Glass Phase in Silver Paste on Metallized Contact Resistance between Rear Silver and Aluminum Electrodes of Crystalline Silicon PERC Cells

Jiefeng Zhang; Hui Li; Hua Tong; Shenghu Xiong; Yunxia Yang; Xiao Yuan; Hongbo Li; Cui Liu

doi:10.3390/app9050891

Applied Sciences (Mar 2019)

Influence of Glass Phase in Silver Paste on Metallized Contact Resistance between Rear Silver and Aluminum Electrodes of Crystalline Silicon PERC Cells

Jiefeng Zhang,
Hui Li,
Hua Tong,
Shenghu Xiong,
Yunxia Yang,
Xiao Yuan,
Hongbo Li,
Cui Liu

Affiliations

Jiefeng Zhang: Key Laboratory for Ultrafine Materials of Ministry of Education, School of Materials Science and Engineering, East China University of Science and Technology, Shanghai 200237, China
Hui Li: Key Laboratory for Ultrafine Materials of Ministry of Education, School of Materials Science and Engineering, East China University of Science and Technology, Shanghai 200237, China
Hua Tong: Key Laboratory for Ultrafine Materials of Ministry of Education, School of Materials Science and Engineering, East China University of Science and Technology, Shanghai 200237, China
Shenghu Xiong: Key Laboratory for Ultrafine Materials of Ministry of Education, School of Materials Science and Engineering, East China University of Science and Technology, Shanghai 200237, China
Yunxia Yang: Key Laboratory for Ultrafine Materials of Ministry of Education, School of Materials Science and Engineering, East China University of Science and Technology, Shanghai 200237, China
Xiao Yuan: Key Laboratory for Ultrafine Materials of Ministry of Education, School of Materials Science and Engineering, East China University of Science and Technology, Shanghai 200237, China
Hongbo Li: Key Laboratory for Ultrafine Materials of Ministry of Education, School of Materials Science and Engineering, East China University of Science and Technology, Shanghai 200237, China
Cui Liu: Key Laboratory for Ultrafine Materials of Ministry of Education, School of Materials Science and Engineering, East China University of Science and Technology, Shanghai 200237, China

DOI: https://doi.org/10.3390/app9050891
Journal volume & issue: Vol. 9, no. 5
p. 891

Abstract

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In the back-side metallization process of the passivated emitter and rear cell (PERC), the contact between the Ag rear electrode and Al rear electrode is an important factor for cell efficiency. In this paper, we report on the effect of Ag paste containing two types of oxide glass frit, V-B-Te and Pb-B-Si, on the Ag/Al contact, owing to their remarkable contrast with regard to the Ag/Al contact resistance. By combining the observation of the Ag/Al interface structure with the investigation on the interaction between glass and Al, glass transition temperature, and the distribution of glass phase in the Ag electrode, the influence of the glass phase on the contact resistance between rear Ag and Al electrodes was clearly elucidated.

Published in Applied Sciences

ISSN: 2076-3417 (Online)
Publisher: MDPI AG
Country of publisher: Switzerland
LCC subjects: Technology: Engineering (General). Civil engineering (General); Science: Biology (General); Science: Physics; Science: Chemistry
Website: http://www.mdpi.com/journal/applsci

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