Measuring epitaxial graphene nanoribbons with low-frequency alternating current

C.-C. Yeh; S. M. Mhatre; N. T. M. Tran; H. M. Hill; H. Jin; P.-C. Liao; D. K. Patel; R. E. Elmquist; C.-T. Liang; A. F. Rigosi

doi:10.1063/5.0147676

AIP Advances (May 2023)

Measuring epitaxial graphene nanoribbons with low-frequency alternating current

C.-C. Yeh,
S. M. Mhatre,
N. T. M. Tran,
H. M. Hill,
H. Jin,
P.-C. Liao,
D. K. Patel,
R. E. Elmquist,
C.-T. Liang,
A. F. Rigosi

Affiliations

C.-C. Yeh: Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899-8171, USA
S. M. Mhatre: Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899-8171, USA
N. T. M. Tran: Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899-8171, USA
H. M. Hill: Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899-8171, USA
H. Jin: Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899-8171, USA
P.-C. Liao: Graduate Institute of Applied Physics, National Taiwan University, Taipei 10617, Taiwan
D. K. Patel: Department of Physics, National Taiwan University, Taipei 10617, Taiwan
R. E. Elmquist: Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899-8171, USA
C.-T. Liang: Department of Physics, National Taiwan University, Taipei 10617, Taiwan
A. F. Rigosi: Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899-8171, USA

DOI: https://doi.org/10.1063/5.0147676
Journal volume & issue: Vol. 13, no. 5
pp. 055112 – 055112-8

Abstract

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We have demonstrated the fabrication of both armchair and zigzag epitaxial graphene nanoribbon (GNR) devices on 4H–SiC using a polymer-assisted sublimation growth method. The phenomenon of terrace step formation has traditionally introduced the risk of GNR deformation along sidewalls, but a polymer-assisted sublimation method helps mitigate this risk. Each type of 50 nm wide GNR is examined electrically and optically (armchair and zigzag), with the latter method being a check on the quality of the GNR devices and the former using alternating current to investigate resistance attenuation from frequencies above 100 Hz. Rates of attenuation are determined for each type of GNR device, revealing subtle suggested differences between armchair and zigzag GNRs.

Published in AIP Advances

ISSN: 2158-3226 (Online)
Publisher: AIP Publishing LLC
Country of publisher: United States
LCC subjects: Science: Physics
Website: http://aipadvances.aip.org/

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