InfoMat (Sep 2024)
Simultaneous resistance switching and rectifying effects in a single hybrid perovskite
- Xuefen Song,
- Junran Zhang,
- Yuchi Qian,
- Zhongjing Xia,
- Jinlian Chen,
- Hao Yin,
- Jing Liu,
- Linbo Feng,
- Tianyu Liu,
- Zihong Zhu,
- Yuyang Hua,
- You Liu,
- Jiaxiao Yuan,
- Feixiang Ge,
- Dawei Zhou,
- Mubai Li,
- Yang Hang,
- Fangfang Wang,
- Tianshi Qin,
- Lin Wang
Affiliations
- Xuefen Song
- School of Flexible Electronics (Future Technologies) & Institute of Advanced Materials (IAM), Key Laboratory of Flexible Electronics (KLOFE), Jiangsu National Synergetic Innovation Center for Advanced Materials (SICAM) Nanjing Tech University (Nanjing Tech) Nanjing People's Republic of China
- Junran Zhang
- School of Flexible Electronics (Future Technologies) & Institute of Advanced Materials (IAM), Key Laboratory of Flexible Electronics (KLOFE), Jiangsu National Synergetic Innovation Center for Advanced Materials (SICAM) Nanjing Tech University (Nanjing Tech) Nanjing People's Republic of China
- Yuchi Qian
- School of Flexible Electronics (Future Technologies) & Institute of Advanced Materials (IAM), Key Laboratory of Flexible Electronics (KLOFE), Jiangsu National Synergetic Innovation Center for Advanced Materials (SICAM) Nanjing Tech University (Nanjing Tech) Nanjing People's Republic of China
- Zhongjing Xia
- School of Flexible Electronics (Future Technologies) & Institute of Advanced Materials (IAM), Key Laboratory of Flexible Electronics (KLOFE), Jiangsu National Synergetic Innovation Center for Advanced Materials (SICAM) Nanjing Tech University (Nanjing Tech) Nanjing People's Republic of China
- Jinlian Chen
- School of Flexible Electronics (Future Technologies) & Institute of Advanced Materials (IAM), Key Laboratory of Flexible Electronics (KLOFE), Jiangsu National Synergetic Innovation Center for Advanced Materials (SICAM) Nanjing Tech University (Nanjing Tech) Nanjing People's Republic of China
- Hao Yin
- School of Flexible Electronics (Future Technologies) & Institute of Advanced Materials (IAM), Key Laboratory of Flexible Electronics (KLOFE), Jiangsu National Synergetic Innovation Center for Advanced Materials (SICAM) Nanjing Tech University (Nanjing Tech) Nanjing People's Republic of China
- Jing Liu
- School of Flexible Electronics (Future Technologies) & Institute of Advanced Materials (IAM), Key Laboratory of Flexible Electronics (KLOFE), Jiangsu National Synergetic Innovation Center for Advanced Materials (SICAM) Nanjing Tech University (Nanjing Tech) Nanjing People's Republic of China
- Linbo Feng
- School of Flexible Electronics (Future Technologies) & Institute of Advanced Materials (IAM), Key Laboratory of Flexible Electronics (KLOFE), Jiangsu National Synergetic Innovation Center for Advanced Materials (SICAM) Nanjing Tech University (Nanjing Tech) Nanjing People's Republic of China
- Tianyu Liu
- School of Flexible Electronics (Future Technologies) & Institute of Advanced Materials (IAM), Key Laboratory of Flexible Electronics (KLOFE), Jiangsu National Synergetic Innovation Center for Advanced Materials (SICAM) Nanjing Tech University (Nanjing Tech) Nanjing People's Republic of China
- Zihong Zhu
- School of Flexible Electronics (Future Technologies) & Institute of Advanced Materials (IAM), Key Laboratory of Flexible Electronics (KLOFE), Jiangsu National Synergetic Innovation Center for Advanced Materials (SICAM) Nanjing Tech University (Nanjing Tech) Nanjing People's Republic of China
- Yuyang Hua
- School of Flexible Electronics (Future Technologies) & Institute of Advanced Materials (IAM), Key Laboratory of Flexible Electronics (KLOFE), Jiangsu National Synergetic Innovation Center for Advanced Materials (SICAM) Nanjing Tech University (Nanjing Tech) Nanjing People's Republic of China
- You Liu
- School of Flexible Electronics (Future Technologies) & Institute of Advanced Materials (IAM), Key Laboratory of Flexible Electronics (KLOFE), Jiangsu National Synergetic Innovation Center for Advanced Materials (SICAM) Nanjing Tech University (Nanjing Tech) Nanjing People's Republic of China
- Jiaxiao Yuan
- School of Flexible Electronics (Future Technologies) & Institute of Advanced Materials (IAM), Key Laboratory of Flexible Electronics (KLOFE), Jiangsu National Synergetic Innovation Center for Advanced Materials (SICAM) Nanjing Tech University (Nanjing Tech) Nanjing People's Republic of China
- Feixiang Ge
- School of Flexible Electronics (Future Technologies) & Institute of Advanced Materials (IAM), Key Laboratory of Flexible Electronics (KLOFE), Jiangsu National Synergetic Innovation Center for Advanced Materials (SICAM) Nanjing Tech University (Nanjing Tech) Nanjing People's Republic of China
- Dawei Zhou
- School of Flexible Electronics (Future Technologies) & Institute of Advanced Materials (IAM), Key Laboratory of Flexible Electronics (KLOFE), Jiangsu National Synergetic Innovation Center for Advanced Materials (SICAM) Nanjing Tech University (Nanjing Tech) Nanjing People's Republic of China
- Mubai Li
- School of Flexible Electronics (Future Technologies) & Institute of Advanced Materials (IAM), Key Laboratory of Flexible Electronics (KLOFE), Jiangsu National Synergetic Innovation Center for Advanced Materials (SICAM) Nanjing Tech University (Nanjing Tech) Nanjing People's Republic of China
- Yang Hang
- School of Flexible Electronics (Future Technologies) & Institute of Advanced Materials (IAM), Key Laboratory of Flexible Electronics (KLOFE), Jiangsu National Synergetic Innovation Center for Advanced Materials (SICAM) Nanjing Tech University (Nanjing Tech) Nanjing People's Republic of China
- Fangfang Wang
- School of Flexible Electronics (Future Technologies) & Institute of Advanced Materials (IAM), Key Laboratory of Flexible Electronics (KLOFE), Jiangsu National Synergetic Innovation Center for Advanced Materials (SICAM) Nanjing Tech University (Nanjing Tech) Nanjing People's Republic of China
- Tianshi Qin
- School of Flexible Electronics (Future Technologies) & Institute of Advanced Materials (IAM), Key Laboratory of Flexible Electronics (KLOFE), Jiangsu National Synergetic Innovation Center for Advanced Materials (SICAM) Nanjing Tech University (Nanjing Tech) Nanjing People's Republic of China
- Lin Wang
- School of Flexible Electronics (Future Technologies) & Institute of Advanced Materials (IAM), Key Laboratory of Flexible Electronics (KLOFE), Jiangsu National Synergetic Innovation Center for Advanced Materials (SICAM) Nanjing Tech University (Nanjing Tech) Nanjing People's Republic of China
- DOI
- https://doi.org/10.1002/inf2.12562
- Journal volume & issue
-
Vol. 6,
no. 9
pp. n/a – n/a
Abstract
Abstract Halide perovskites with naturally coupled electron‐ion dynamics hold great potential for nonvolatile memory applications. Self‐rectifying memristors are promising as they can avoid sneak currents and simplify device configuration. Here we report a self‐rectifying memristor firstly achieved in a single perovskite (NHCINH3)3PbI5 (abbreviated as (IFA)3PbI5), which is sandwiched by Ag and ITO electrodes as the simplest cell in a crossbar array device configuration. The iodide ions of (IFA)3PbI5 can be easily activated, of which the migration in the bulk contributes to the resistance hysteresis and the reaction with Ag at the interface contributes to the spontaneous formation of AgI. The perfect combination of n‐type AgI and p‐type (IFA)3PbI5 gives rise to the rectification function like a p–n diode. Such a self‐rectifying memristor exhibits the record‐low set power consumption and voltage. This work emphasizes that the multifunction of ions in perovskites can simplify the fabrication procedure, decrease the programming power, and increase the integration density of future memory devices.
Keywords