APL Materials (Feb 2019)

Solar blind Schottky photodiode based on an MOCVD-grown homoepitaxial β-Ga2O3 thin film

  • Fikadu Alema,
  • Brian Hertog,
  • Partha Mukhopadhyay,
  • Yuewei Zhang,
  • Akhil Mauze,
  • Andrei Osinsky,
  • Winston V. Schoenfeld,
  • James S. Speck,
  • Timothy Vogt

DOI
https://doi.org/10.1063/1.5064471
Journal volume & issue
Vol. 7, no. 2
pp. 022527 – 022527-6

Abstract

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We report on a high performance Pt/n−Ga2O3/n+Ga2O3 solar blind Schottky photodiode that has been grown by metalorganic chemical vapor deposition. The active area of the photodiode was fabricated using ∼30 Å thick semi-transparent Pt that has up to 90% transparency to UV radiation with wavelengths < 260 nm. The fabricated photodiode exhibited Schottky characteristics with a turn-on voltage of ∼1 V and a rectification ratio of ∼108 at ±2 V and showed deep UV solar blind detection at 0 V. The Schottky photodiode exhibited good device characteristics such as an ideality factor of 1.23 and a breakdown voltage of ∼110 V. The spectral response showed a maximum absolute responsivity of 0.16 A/W at 222 nm at zero bias corresponding to an external quantum efficiency of ∼87.5%. The cutoff wavelength and the out of band rejection ratio of the devices were ∼260 nm and ∼104, respectively, showing a true solar blind operation with an excellent selectivity. The time response is in the millisecond range and has no long-time decay component which is common in photoconductive wide bandgap devices.