Structural and morphological data of RF-Sputtered BiVO4 thin films

R. Venkatesan; S. Velumani; K. Ordon; M. Makowska-Janusik; G. Corbel; A. Kassiba

Data in Brief (Apr 2018)

Structural and morphological data of RF-Sputtered BiVO4 thin films

R. Venkatesan,
S. Velumani,
K. Ordon,
M. Makowska-Janusik,
G. Corbel,
A. Kassiba

Affiliations

R. Venkatesan: Department of Electrical Engineering (SEES), CINVESTAV-IPN, Zacatenco, Av IPN #2508, Col Zacatenco, D.F. C.P. 07360, Mexico; Institute of Molecular and Materials of Le Mans – UMR-CNRS 6283, Le Mans University, 70285 Le Mans, Lns France
S. Velumani: Department of Electrical Engineering (SEES), CINVESTAV-IPN, Zacatenco, Av IPN #2508, Col Zacatenco, D.F. C.P. 07360, Mexico; Corresponding authors.
K. Ordon: Institute of Molecular and Materials of Le Mans – UMR-CNRS 6283, Le Mans University, 70285 Le Mans, Lns France; Institute of Physics, Jan Dlugosz University in Czestochowa, Al.Armii Krajowej, 13/15, 42 200 Czestochowa, Poland
M. Makowska-Janusik: Institute of Physics, Jan Dlugosz University in Czestochowa, Al.Armii Krajowej, 13/15, 42 200 Czestochowa, Poland
G. Corbel: Institute of Molecular and Materials of Le Mans – UMR-CNRS 6283, Le Mans University, 70285 Le Mans, Lns France
A. Kassiba: Institute of Molecular and Materials of Le Mans – UMR-CNRS 6283, Le Mans University, 70285 Le Mans, Lns France; Corresponding authors.

Journal volume & issue: Vol. 17
pp. 526 – 528

Abstract

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Structural and morphological modulation of rf-sputtered BiVO4 thin films deposited using mechanochemical synthesis prepared BiVO4 nano-powders as sintered target are included in this data article. The crystalline nature of as-prepared films, namely amorphous and crystalline was acquired with time and temperature dependent in-situ high temperature X-ray diffraction (HT-XRD), at a time interval of 1 h. Typical Fourier transform infrared (FT-IR) spectra of annealed thin film of monoclinic BiVO4 structure is given. Furthermore, correlation between morphologies of various substrate temperature fabricated BiVO4 thin films are presented.

Published in Data in Brief

ISSN: 2352-3409 (Online)
Publisher: Elsevier
Country of publisher: United States
LCC subjects: Medicine: Medicine (General): Computer applications to medicine. Medical informatics; Science: Science (General)
Website: http://www.journals.elsevier.com/data-in-brief/

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