IEEE Photonics Journal (Jan 2013)

Monolithic Integration of Surface Plasmon Detector and Metal–Oxide–Semiconductor Field-Effect Transistors

  • Takuma Aihara,
  • Masashi Fukuhara,
  • Ayumi Takeda,
  • Byounghyun Lim,
  • Masato Futagawa,
  • Yuya Ishii,
  • Kazuaki Sawada,
  • Mitsuo Fukuda

DOI
https://doi.org/10.1109/JPHOT.2013.2272779
Journal volume & issue
Vol. 5, no. 4
pp. 6800609 – 6800609

Abstract

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The monolithic integration of a silicon-based plasmonic detector with metal- oxide-semiconductor field-effect transistors (MOSFETs) was demonstrated. The plasmonic detector consisted of a gold film with a nanoslit grating on a silicon substrate and was operated at a free-space wavelength of 1550 nm. The structure of the nanoslit grating was optimized by using the finite-difference time-domain method. The output current from the plasmonic detector was amplified by ~14 000 times using the monolithically integrated MOSFETs. In addition, dynamic operation of the integrated circuit was demonstrated by modulation of the intensity of a beam that was incident to the plasmonic detector.

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