A new approach for serial electron diffraction data collection

Abstract

This commentary describes a novel method for serial electron diffraction data collection in electron crystallography, utilizing a scanning transmission electron microscope to rapidly obtain patterns with low radiation dose. This approach, demonstrated with zeolite samples, has the potential to provide highly automated and rapid structures from nanocrystalline materials.

Keywords

• serial electron diffraction
• scanning transmission electron microscopy
• structure determination
• nanocrystallography
• beam-sensitive materials
• zeolites