Soft X-ray Diagnostic System Upgrades and Data Quality Monitoring Features for Tokamak Usage

Abstract

The validation of the measurements quality after on-site diagnostic system installation is necessary in order to provide reliable data and output results. This topic is often neglected or not discussed in detail regarding measurement systems. In the paper recently installed system for soft X-ray measurements is described in introduction. The system is based on multichannel GEM detector and the data is collected and sent in special format to PC unit for further postprocessing. The unique feature of the system is the ability to compute final data based on raw data only. The raw data is selected upon algorithms by FPGA units. The FPGAs are connected to the analog frontend of the system and able to register all of the signals and collect the useful data. The interface used for data streaming is PCIe Gen2 x4 for each FPGA, therefore high throughput of the system is ensured. The paper then discusses the properties of the installation environment of the system and basic functionality mode. New features are described, both in theoretical and practical approach. New modes correspond to the data quality monitoring features implemented for the system, that provide extra information to the postprocessing stage and final algorithms. In the article is described also additional mode to perform hardware simulation of signals in a tokamak-like environment using FPGAs. The summary describes the implemented features of the data quality monitoring features and additional modes of the system.

Keywords

• data quality monitoring
• fpga
• verilog/vhdl
• hdl
• gem detector
• sxr plasma diagnostics
• modular measurement system
• data evaluation
• tokamak