The Directory of Open Access Journals
DOAJ Logotype
Open
Global
Trusted
Main actions
Support
Institutions and libraries
Publishers
Institutional and library supporters
Apply
Application form
Guide to applying
The DOAJ Seal
Transparency & best practice
Publisher information
Licensing & copyright
Search
Menu
Secondary actions
Search
Journals
Articles
Documentation
API
OAI-PMH
Widgets
Public data dump
OpenURL
XML
Metadata help
Preservation
About
About DOAJ
DOAJ at 20
DOAJ team
Ambassadors
Advisory Board & Council
Volunteers
News
Support
Institutions and libraries
Publishers
Institutional and library supporters
Apply
Application form
Guide to applying
The DOAJ Seal
Transparency & best practice
Publisher information
Licensing & copyright
Login
Login
Quick search
Close
×
Journals
Articles
Search by keywords:
In the field:
In all fields
Title
ISSN
Subject
Publisher
Country of publisher
Search
Julius-Kühn-Archiv
(Jul 2018)
Simple modelling approaches to refine exposure for bee risk assessment based on worst case assumptions
Miles, Mark,
Gao, Zhenglei,
Preuss, Thomas
Affiliations
Miles, Mark
Bayer CropScience, Monheim am Rhein, Germany
Gao, Zhenglei
Bayer CropScience, Monheim am Rhein, Germany
Preuss, Thomas
Bayer CropScience, Monheim am Rhein, Germany
DOI
https://doi.org/10.5073/jka.2018.462.007
Journal volume & issue
Vol. 462
pp. 38 – 38
Abstract
Read online
No abstracts available.
WeChat QR code
Close
