Measurement of the optical dielectric properties of thin-film materials by ultrafast time-resolved interferometry

Hai-Ying Song; Peng Wang; Qi-Ni Ge; Ya-Chao Li; Elshaimaa M. Emara; Mei-Rong Lu; Shi-Bing Liu

Results in Physics (Mar 2020)

Measurement of the optical dielectric properties of thin-film materials by ultrafast time-resolved interferometry

Hai-Ying Song,
Peng Wang,
Qi-Ni Ge,
Ya-Chao Li,
Elshaimaa M. Emara,
Mei-Rong Lu,
Shi-Bing Liu

Affiliations

Hai-Ying Song: Strong-field and Ultrafast Photonics Lab, Key Laboratory of Trans-scale Laser Manufacturing Technology, Ministry of Education, Institute of Laser Engineering, Beijing University of Technology, Beijing 100124, China; Beijing Engineering Research Center of Laser Technology, Beijing University of Technology, Beijing 100124, China
Peng Wang: Strong-field and Ultrafast Photonics Lab, Key Laboratory of Trans-scale Laser Manufacturing Technology, Ministry of Education, Institute of Laser Engineering, Beijing University of Technology, Beijing 100124, China; Beijing Engineering Research Center of Laser Technology, Beijing University of Technology, Beijing 100124, China
Qi-Ni Ge: Strong-field and Ultrafast Photonics Lab, Key Laboratory of Trans-scale Laser Manufacturing Technology, Ministry of Education, Institute of Laser Engineering, Beijing University of Technology, Beijing 100124, China; Beijing Engineering Research Center of Laser Technology, Beijing University of Technology, Beijing 100124, China
Ya-Chao Li: Strong-field and Ultrafast Photonics Lab, Key Laboratory of Trans-scale Laser Manufacturing Technology, Ministry of Education, Institute of Laser Engineering, Beijing University of Technology, Beijing 100124, China; Beijing Engineering Research Center of Laser Technology, Beijing University of Technology, Beijing 100124, China
Elshaimaa M. Emara: Strong-field and Ultrafast Photonics Lab, Key Laboratory of Trans-scale Laser Manufacturing Technology, Ministry of Education, Institute of Laser Engineering, Beijing University of Technology, Beijing 100124, China; Beijing Engineering Research Center of Laser Technology, Beijing University of Technology, Beijing 100124, China
Mei-Rong Lu: Strong-field and Ultrafast Photonics Lab, Key Laboratory of Trans-scale Laser Manufacturing Technology, Ministry of Education, Institute of Laser Engineering, Beijing University of Technology, Beijing 100124, China; Beijing Engineering Research Center of Laser Technology, Beijing University of Technology, Beijing 100124, China
Shi-Bing Liu: Strong-field and Ultrafast Photonics Lab, Key Laboratory of Trans-scale Laser Manufacturing Technology, Ministry of Education, Institute of Laser Engineering, Beijing University of Technology, Beijing 100124, China; Beijing Engineering Research Center of Laser Technology, Beijing University of Technology, Beijing 100124, China; Corresponding author at: Strong-field and Ultrafast Photonics Lab, Key Laboratory of Trans-scale Laser Manufacturing Technology, Ministry of Education, Institute of Laser Engineering, Beijing University of Technology, Beijing 100124, China.

Journal volume & issue: Vol. 16
p. 102958

Abstract

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We report a time-resolved optic interferometry (TROI) that enables to straightway probe the optical properties of traditional and special thin-film materials by feat of a phase delayed-interference between double beams of femtosecond laser synchronously traveling through vacuum (air) and sample, respectively. As a verification of measurement accuracy created by the TROI, the group and phase velocities as well as the refractive index of noncrystal thin-film HfO2, the crystal thin-film materials YAG (isotropic cubic system), and LiNbO3 (aeolotropic rigonal system), are measured by femtosecond laser pulse with 800 nm central wavelength. The data exhibit a satisfactory consequence in which even a subtle change of measurand can be ascertained by manipulating the resolution in temporal and spacial domains via the delay-line, whether the films are isotropic or aeolotropic and any different orientations of sample. Unambiguously, the presented TROI is conspicuous to the precision measurements of environment-dependent and phase-sensitive optical parameters especially involved in specific nanoscale optical devices and structured layers or coatings.

Published in Results in Physics

ISSN: 2211-3797 (Online)
Publisher: Elsevier
Country of publisher: Netherlands
LCC subjects: Science: Physics
Website: http://www.journals.elsevier.com/results-in-physics/

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