Conductivity mapping of topographically complex surfaces using contact-mode carbon fibre in potentiometric SECM

Abstract

In numerous scientific and engineering applications, it is imperative to study the reactivity of material surfaces at a microscopic level. Scanning electrochemical microscopy (SECM) is a prevalent technique utilized to investigate and probe the electrochemical properties of surfaces. However, due to the inherent dependence of SECM on the distance between the sample and tip, uneven samples can pose a challenge, resulting in inaccurate measurements and incomplete understanding of material behavior. In this paper, we propose a novel approach for resolving this issue using contact-mode carbon fiber electrodes in potentiometric mode. The methodology introduced in this study presents a progressive development over the conventional feedback mode in certain circumstances, as it is capable of monitoring sample conductivity independent of its topography. This paper exemplifies two specific cases involving a tilted and a rough surface. A comparative analysis of the results obtained using the conventional feedback mode and the proposed method was conducted to further validate its efficacy. The findings demonstrate that the proposed method is highly effective in studying tilted and rugged substrates.

Keywords

• Scanning electrochemical microscopy (SECM)
• Potentiometry
• Topography