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ACS Omega
(Nov 2018)
High-Quality 100 nm Thick InSb Films Grown on GaAs(001) Substrates with an InxAl1–xSb Continuously Graded Buffer Layer
Soo Seok Kang,
Suk In Park,
Sang Hoon Shin,
Cheol-Hwee Shim,
Suk-Ho Choi,
Jin Dong Song
Affiliations
Soo Seok Kang
†Center for Opto-Electronic Material and Devices, Korea Institute of Science and Technology, Seoul, Republic of Korea
Suk In Park
†Center for Opto-Electronic Material and Devices, Korea Institute of Science and Technology, Seoul, Republic of Korea
Sang Hoon Shin
†Center for Opto-Electronic Material and Devices, Korea Institute of Science and Technology, Seoul, Republic of Korea
Cheol-Hwee Shim
§Advanced Analysis Center, Korea Institute of Science and Technology, Seoul, Republic of Korea
Suk-Ho Choi
Department of Applied Physics and Institute of Natural Sciences, College of Applied Science, Kyung Hee University, Yongin, Republic of Korea
Jin Dong Song
Department of Applied Physics and Institute of Natural Sciences, College of Applied Science, Kyung Hee University, Yongin, Republic of Korea
DOI
https://doi.org/10.1021/acsomega.8b02189
Journal volume & issue
Vol. 3, no. 11
pp. 14562 – 14566
Abstract
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