Materials Letters: X (Sep 2020)

Investigation of a novel AlZnN semiconductor alloy

  • A. Trapalis,
  • P.W. Fry,
  • K. Kennedy,
  • I. Farrer,
  • A. Kean,
  • J. Sharman,
  • J. Heffernan

Journal volume & issue
Vol. 7
p. 100052

Abstract

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The formation of an AlZnN alloy was investigated as a route to tune the bandgap of Zn3N2. A significant shift of the bandgap was observed in the deposited films, increasing from 1.4 eV for Zn3N2 to 2.8 eV for AlZnN alloys with an AlN fraction of × = 0.19. The refractive index followed a similar trend, approaching that of AlN. The charge carrier density of AlZnN samples was significantly reduced reaching values in the order of 1016 cm−3.

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