Evaluation of threshold conditions for latent track formation in nanocrystalline Y2Ti2O7

Abstract

We present the first report on the structural effects induced by swift xenon ions in nanocrystalline pyrochlore Y2Ti2O7 (outside the metal matrix) studied using high resolution transmission electron microscopy. Latent amorphous tracks were observed in the range of electronic stopping powers 4.8–23.2 keV/nm. Obtained results enabled estimation of the threshold energy loss values for formation of continuous and not continuous (surface) tracks at ≈ 8 keV/nm and 3.5 keV/nm, respectively.

Keywords

• nanocrystalline materials
• y2ti2o7 pyrochlore
• swift heavy ions
• latent tracks
• transmission electron microscopy (tem)