Electrical Conduction Mechanism of Mg-Doped ZrO₂ Thin Films

Abstract

Amorphous ZrO2 thin films with increasing Mg content were deposited on quartz substrates, by dip coating method. The films are transparent in the visible domain and absorbent in UV, with an optical band gap that decreases with the increase of Mg content, from 5.42 eV to 4.12 eV. The temperature dependent conductivity measurements showed typical semiconductor comportment. The decrease of the electrical conductivity by Mg doping was related to the increase of the OH groups (37% to 63%) as seen from X-ray Photoelectron Spectroscopy. It was found out that the electrical conductivity obeys the Meyer-Neldel rule. This rule, previously reported for different disordered material systems is obtained for ZrO2 for the first time in the literature. Exploring novel aspects of Mg-doped ZrO2, the present study underscores the origin of the Meyer-Neldel rule explained by the small-polaron hopping model in the non-adiabatic hopping regime. Determination of the presence of such a conduction mechanism in the samples hold promise for comprehending the important aspects, which might be a concern in developing various devices based on Mg-doped ZrO2.

Keywords

• Mg doped ZrO₂
• thin films
• XPS
• electrical conductivity
• Meyer-Neldel rule