Low Power Testing—What Can Commercial Design-for-Test Tools Provide?

Abstract

Minimizing power consumption during functional operation and during manufacturing tests has become one of the dominant requirements for the semiconductor designs in the past decade. From commercial design-for-test (DFT) tools’ point of view, this paper describes how DFT tools can help to achieve comprehensive testing of low power designs and reduce test power consumption during test application.

Keywords

• low-power design
• low-power testing
• scan testing
• test compression
• DFT tools