Trusted Node QKD at an Electrical Utility

Philip G. Evans; Muneer Alshowkan; Duncan Earl; Daniel D. Mulkey; Raymond Newell; Glen Peterson; Claira Safi; Justin L. Tripp; Nicholas A. Peters

doi:10.1109/ACCESS.2021.3070222

IEEE Access (Jan 2021)

Trusted Node QKD at an Electrical Utility

Philip G. Evans,
Muneer Alshowkan,
Duncan Earl,
Daniel D. Mulkey,
Raymond Newell,
Glen Peterson,
Claira Safi,
Justin L. Tripp,
Nicholas A. Peters

Affiliations

Philip G. Evans: ORCiD; Quantum Information Science Group, Computational Sciences and Engineering Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Muneer Alshowkan: ORCiD; Quantum Information Science Group, Computational Sciences and Engineering Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Duncan Earl: Qubitekk Inc., Vista, CA, USA
Daniel D. Mulkey: Qubitekk Inc., Vista, CA, USA
Raymond Newell: ORCiD; Los Alamos National Laboratory, Los Alamos, NM, USA
Glen Peterson: Los Alamos National Laboratory, Los Alamos, NM, USA
Claira Safi: Los Alamos National Laboratory, Los Alamos, NM, USA
Justin L. Tripp: ORCiD; Los Alamos National Laboratory, Los Alamos, NM, USA
Nicholas A. Peters: ORCiD; Quantum Information Science Group, Computational Sciences and Engineering Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA

DOI: https://doi.org/10.1109/ACCESS.2021.3070222
Journal volume & issue: Vol. 9
pp. 105220 – 105229

Abstract

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Challenges facing the deployment of quantum key distribution (QKD) systems in critical infrastructure protection applications include the optical loss-key rate tradeoff, addition of network clients, and interoperability of vendor-specific QKD hardware. Here, we address these challenges and present results from a recent field demonstration of three QKD systems on a real-world electric utility optical fiber network.

Published in IEEE Access

ISSN: 2169-3536 (Online)
Publisher: IEEE
Country of publisher: United States
LCC subjects: Technology: Electrical engineering. Electronics. Nuclear engineering
Website: https://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6287639

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