The Impact of Excitation Periods on the Outcome of Lock-In Thermography

Abstract

Thermal imaging is a non-destructive test method that uses an external energy source, such as a halogen lamp or flash lamp, to excite the material under test and measure the resulting temperature distribution. One of the important parameters of lock-in thermography is the number of excitation periods, which is used to calculate a phase image that shows defects or inhomogeneities in the material. The results for multiple periods can be averaged, which leads to noise suppression, but the use of a larger number of periods may cause an increase in noise due to unsynchronization of the camera and the external excitation source or may lead to heating and subsequent damage to the sample. The phase image is the most common way of representing the results of lock-in thermography, but amplitude images and complex images can also be obtained. In this study, eight measurements were performed on different samples using a thermal pulse source (flash lamp and halogen lamp) with a period of 120 s. For each sample, five phase images were calculated using different number of periods, preferably one to five periods. The phase image calculated from one period was used as a reference. To determine the effect of the number of excitation periods on the phase image, the reference phase image for one period was compared with the phase images calculated using multiple periods using the structural similarity index (SSIM) and multi-scale SSIM (MS-SSIM).

Keywords

• infrared camera
• non-destructive testing (NDT)
• image processing
• structural similarity index measure (<i>SSIM</i>)
• lock-in thermography