Scientific Reports (Oct 2024)

Author Correction: Improved oxidation behavior of Hf0.11Al0.20B0.69 in comparison to Hf0.28B0.72 magnetron sputtered thin films

  • Pauline Kümmerl,
  • Sebastian Lellig,
  • Amir Hossein Navidi Kashani,
  • Marcus Hans,
  • Peter J. Pöllmann,
  • Lukas Löfler,
  • Ganesh Kumar Nayak,
  • Damian M. Holzapfel,
  • Szilárd Kolozsvári,
  • Peter Polcik,
  • Peter Schweizer,
  • Daniel Primetzhofer,
  • Johann Michler,
  • Jochen M. Schneider

DOI
https://doi.org/10.1038/s41598-024-75854-8
Journal volume & issue
Vol. 14, no. 1
pp. 1 – 1

Abstract

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