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BIO Web of Conferences
(Jan 2024)
Determination of Ti3C2Tx Mxene few layers stacks architecture using valence EELS and diffraction
Pacaud Jerome,
Hsiao Haw-Wen,
Yuan Renliang,
Celerier Stephane,
Zuo Jian-Min,
Mauchamp Vincent,
Bilyk Thomas
Affiliations
Pacaud Jerome
Institut Pprime – UPR 3346 – CNRS, Université de Poitiers
Hsiao Haw-Wen
Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign
Yuan Renliang
Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign
Celerier Stephane
IC2MP – UMR 7285 – CNRS, Université de Poitiers
Zuo Jian-Min
Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign
Mauchamp Vincent
Institut Pprime – UPR 3346 – CNRS, Université de Poitiers
Bilyk Thomas
Université Paris-Saclay, CEA, Service de recherche en Corrosion et Comportement des Matériaux, SRMP
DOI
https://doi.org/10.1051/bioconf/202412922009
Journal volume & issue
Vol. 129
p. 22009
Abstract
Read online
No abstracts available.
Keywords
low-loss
thickness measurement
diffraction
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