Journal of Microwaves, Optoelectronics and Electromagnetic Applications ()

A load effect evaluation of a transmission line exciting chamber

  • Mario. A. Santos Jr.,
  • Damien Voyer,
  • Ronan Perrussel,
  • Djonny Weinzierl,
  • Carlos. A. F. Sartori,
  • Laurent Krähenbühl,
  • Christian Vollaire,
  • José R. Cardoso

DOI
https://doi.org/10.1590/S2179-10742011000100005
Journal volume & issue
Vol. 10, no. 1
pp. 42 – 54

Abstract

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This paper presents an evaluation of the phase shifting excitation and load effects in a Transmission Line Exciting Chamber. This chamber is suggested as an alternative for immunity tests because of the restrictions related to canonical chambers. Here, two methods are used to calculate the E-field: a semi-analytic approach and a numerical one. The semi-analytic method is based on the modal expansion while a software is used for numerical simulations. The results regarding the E-field profile and the related statistical indexes of merit are presented and used to evaluate the chamber performances. Experiments were also conducted in order to evaluate the chamber.

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