Study on Optical Properties of Micro-Modulator Through <inline-formula> <tex-math notation="LaTeX">$Z$</tex-math></inline-formula>-Scanning Method

Abstract

Stokes polarimeters and scanning slit optical beam profilers are used to measure the polarization properties and optical spot intensities of a laser beam, which go through the micromodulator by the Z-scanning method. The polarization properties of a S-polarized and a P-polarized light are researched. The optical intensities of laser beam are obtained for S-polarized light by the Z-scanning method. The results show that the groove films can affect the polarization properties of the P-polarized light but do not change the polarization properties of the S-polarized light. The optical spot intensity of S-polarized light can be changed with the help of groove films as the scattering effect.

Keywords

• Optical and other properties
• Light-material interactions
• Sensors