AN ANALYSIS ON IMPROVEMENT OF X-RAY DIFFRACTOMETER RESULTS BY CONTROLLING AND CALIBRATION OF PARAMETERS

Abstract

The X-ray diffractometer in the laboratory is a crucial instrument for analyzing materials in science. It can be used on almost any crystal material, and if the machine parameters are appropriately controlled, it can offer a lot of information about the sample’s characteristics. Nevertheless, the data obtained from these machines are complicated by an aberration function that can be resolved through calibration. In this study, a powder comprising of Barium Sulfate (BaSO4), Zinc Oxide (ZnO) and Aluminum (Al) was used as the first sample and a single crystal sample comprised of Gallium Nitride (GaN) and Aluminum Oxide (Al2O3). The required calibration parameters of the X-ray diffractometer namely: Straight Beam Alignment, Beam Cut Alignment and Sample Tilt Alignment for two samples were analyzed and carried out. Using the results of the Xray spectrum, important parameters such as corresponding planes for peak positions, d-spacing of planes, intensities, smallest crystallite sizes and lattice parameters, and a comparison with the reference data were all carried out. As another result, the out-of-plane alignment and Full-Widthat Half-Maximum (FWHM) value for GaN could be determined using the rocking curve.

Keywords

• scanning electron microscopy
• energy-dispersive x-ray spectroscopy
• backscattered electron image
• secondary electron imaging
• calibration
• mems