East European Journal of Physics (Mar 2024)

Phase Formation Process in CdSe Thin Films

  • L.N. Ibrahimova,
  • N.M. Abdullayev,
  • M.E. Aliyev,
  • G.A. Garashova,
  • Y.I. Aliyev

DOI
https://doi.org/10.26565/2312-4334-2024-1-54
Journal volume & issue
no. 1
pp. 493 – 496

Abstract

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In this work, thin films of cadmium selenide of difrent thicknesses were obtained by chemical deposition and the processes of phase formation in them were studied. Thin layers with a thickness of d = 150 – 500 nm were obtained. Structural studies were carried out using X-ray diffraction. The spectra obtained at room temperature were analyzed. The presence of structural features of the CdSe compound in thin layers has been established. After a thickness d = 400 nm, the process of phase formation begins. The observed atomic planes and Miller indices during the phase formation process are determined.

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