Phytopathology Research (Nov 2024)

Development and characterization of a novel wheat-rye T2DS·2DL-2RL translocation line with high stripe rust resistance

  • Yuzhou Ji,
  • Guohao Han,
  • Wenping Gong,
  • Ran Han,
  • Xiaolu Wang,
  • Yinguang Bao,
  • Jianbo Li,
  • Aifeng Liu,
  • Haosheng Li,
  • Jianjun Liu,
  • Pengtao Ma,
  • Cheng Liu

DOI
https://doi.org/10.1186/s42483-024-00281-6
Journal volume & issue
Vol. 6, no. 1
pp. 1 – 10

Abstract

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Abstract Rye (Secale cereale L.), a close relative of common wheat, represents a valuable genetic resource for enhancing the disease resistance of common wheat. Introducing novel rye-derived genes into wheat can potentially improve disease resistance. In this study, we successfully developed a novel wheat-rye derivative line LCR4 through hybridization between hexaploid triticale line Currency and common wheat cultivar Jimai 22 (JM22). We confirmed that LCR4 was a T2DS·2DL-2RL translocation line via comprehensive molecular cytogenetic analyses, including genomic in situ hybridization, multi-color fluorescence in situ hybridization, molecular marker analysis, and wheat SNP-arrays genotyping. Notably, upon inoculation with Puccinia striiformis f. sp. tritici (Pst) race V26 at the seedling stage and mixed Pst races at the adult stage, LCR4 exhibited robust resistance against stripe rust infection at both stages. Subsequent genetic analysis further elucidated that the translocated 2RL chromosome segment is responsible for this resistance. Consequently, LCR4 harboring elite agronomic traits can be effectively employed in breeding programs against stripe rust.

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