Journal of Science: Advanced Materials and Devices (Jun 2017)

Electrochromic behavior of NiO film prepared by e-beam evaporation

  • D.R. Sahu,
  • Tzu-Jung Wu,
  • Sheng-Chang Wang,
  • Jow-Lay Huang

DOI
https://doi.org/10.1016/j.jsamd.2017.05.001
Journal volume & issue
Vol. 2, no. 2
pp. 225 – 232

Abstract

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The NiO thin films were prepared by the electron beam evaporation method using synthesized sintered targets. As-prepared films were characterized using X-ray diffraction, scanning electron microscopy, UV–VIS spectroscopy and cyclic voltammetry. The thicker films were found to exhibit a well-defined structure and a well-developed crystallite size with greater transmittance modulation and durability. The as-deposited thinner films of 170 nm showed a faster response time during electrochromic cycles with a coloration efficiency of 53.1 C/cm2 than the thicker ones. However, the thicker films showed no enhanced electrochromic properties such as a larger intercalated charge than the thinner ones. The electrochromic properties of the thinner films became deteriorated after 800 cycling tests.

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