Tip-enhanced photoluminescence of monolayer MoS2 increased and spectrally shifted by injection of electrons

Abstract

Using tip-enhanced photoluminescence (TEPL), we investigate micron-size monolayer MoS2 flakes. In a sequence of studies, we apply various voltages between the Ag-coated nano-tip and the MoS2 flakes and observe an intriguing result. During the TEPL measurement, we observe that the photoluminescence spectrum is blue shifted and the overall signal intensity is increased. We attribute this behavior to plasmon-induced electron injection into MoS2. Additionally, when the tip is negatively biased with respect to the sample during the TEPL measurement, the nonuniform TEPL images of MoS2 monolayer flakes containing defects are gradually changed to be uniform that reach saturation. We verify that this saturation state in TEPL can last over half a year.

Keywords

• defect
• monolayer mos2
• plasmon-induced electron injection
• tip-enhanced photoluminescence