Stability and reliability analysis of a non‐isolated high gain DC‐DC converter

Abstract

Abstract This paper investigates the stability and reliability analysis of a non‐isolated high‐gain DC‐DC converter. The proposed DC‐DC converter produces a high gain output voltage with a lower duty ratio and reduced voltage stress on the semiconductor switch. A reliability analysis is performed to predict the failure rate and lifetime of the individual components using the military handbook (MIL‐HDBK‐217F). A state space equation and small signal modeling of the proposed converter are derived to elucidate the performance of the proposed converter through stability analysis. A closed‐loop using PID controller is incorporated to attain the constant regulated output voltage during sudden parameter changes. The validation of the closed‐loop using the PID controller is verified with the wide range of variations in the different parameters, such as input voltage, load value, and reference voltage value. The laboratory‐based prototype is developed for the proposed converter and validated the performance with 250 W. The power density and efficiency of the proposed converter are 1.360 kW/L and 93%, respectively.

Keywords

• closed loop systems
• DC‐DC power convertors
• power electronics
• reliability